10.12.2 10V LDPMOS rules

This is to define P type asymmetrical 10V LDMOS device (LDPMOS) Below is a summary table as how to identify the device.

LDPMOS

Items

Layers or Logic operations for identifying the device and its nodes

LDPMOS

Device under LDMOS_XTOR with Dualgate and COMP, Poly2, MVPSD

LDPMOS Drain

MVPSD

LDPMOS Source

((Pplus AND COMP) Interact (((Poly2 AND Dualgate) AND LDMOS_XTOR) AND

MVPSD)) NOT Poly2

LDPMOS Channel Length

MVPSD space to POLY2 edge in COMP

LDPMOS Channel Width

LDPMOS COMP width intersecting with (((POLY2 AND Dualgate) AND

(LDMOS_XTOR Interact MVPSD))

LDPMOS rules

Rule NO

Description

Layout Rule

MDP.1

Minimum transistor channel length

0.6

MDP.1a

Max transistor channel length

20

MDP.2

Minimum transistor channel width

4

MDP.3

Each LDPMOS shall be surrounded by non-broken Nplus guard ring inside DNWELL. Nplus

guard ring shall be connected to the highest potential. It is better to put wider than minimum

guard ring for latch-up prevention if LDNMOS and LDPMOS are adjacent to each other

(refer to latch-up guidelines in section 14.5.4).

MDP.3ai

Min NCOMP (Nplus AND COMP) space to MVPSD (source and body tap non-butted)

NCOMP (Nplus AND COMP) intercept with MVPSD is not allowed

1

MDP.3aii

Min NCOMP (Nplus AND COMP) space to MVPSD (source and body tap butted)

NCOMP (Nplus AND COMP) intercept with MVPSD is not allowed

0.92

MDP.3b

Min NCOMP (Nplus AND COMP) space to PCOMP in DNWELL (Pplus AND COMP AND

DNWELL). Use butted source and DNWELL contacts otherwise and that is best for Latch-up

immunity as well

0.4

MDP.3c

Maximum distance of the nearest edge of the DNWELL tab (NCOMP inside DNWELL)

from PCOMP edge (PCOMP inside DNWELL)

15

MDP.3d

The metal connection for the Nplus guard ring recommended to be continuous,

The maximum gap between this metal if broken

Note: To put maximum number of contact under metal for better manufacturability and

reliability

10

MDP.4

DNWELL covering LDPMOS shall be surrounded by non broken Pplus guard

The metal connection for the Pplus guard ring recommended to be continuous, The maximum

gap between this metal if broken.

Note: To put maximum number of contact under metal for better manufacturability and Reliability

10

MDP.4a

Min PCOMP (Pplus AND COMP) space to DNWELL

2.5

MDP.4b

Maximum distance of the nearest edge of the DNWELL from the PCOMP Guard ring outside DNWELL

15

MDP.5

Each LDPMOS shall be covered by Dualgate layer,

MDP.5a

Minimum Dualgate enclose Plus guarding ring PCOMP (Pplus AND COMP)

0.5

MDP.6

Each LDPMOS shall be covered by LDMOS_XTOR (GDS#226) layer

MDP.6a

Minimum LDMOS_XTOR enclose Dualgate

0

MDP.7

Minimum LDMOS_XTOR (GDS#226) layer space to Nwell outside LDMOS_XTOR

2

MDP.8

Minimum LDMOS_XTOR (GDS#226) layer space to NCOMP (Nplus AND COMP) outside

LDMOS_XTOR (GDS#226)

1.5

MDP.9

POLY2 rules

MDP.9a

Min LDPMOS POLY2 width (POLY2 inside DNWELL AND LDMOS_XTOR (GDS#226))

1.2

MDP.9b

Min POLY2 extension beyond COMP in the width direction of the transistor (other

than the LDMOS drain direction)

0.4

MDP.9c

Min/Max POLY2 extension beyond COMP on the field towards LDPMOS drain

(MVPSD AND COMP AND Pplus NOT POLY2) direction

0.2

MDP.9d

Min/Max POLY2 on field to LDPMOS drain COMP (MVPSD AND COMP AND

Pplus NOT POLY2) space

0.16

MDP.9ei

Min LDMPOS gate Poly2 space to Nplus guardring (source and body tap non-

Butted)

0.4

MDP.9eii

Min LDMPOS gate Poly2 space to Nplus guardring (source and body tap butted)

0.32

MDP.9f

Poly2 interconnect is not allowed in LDPMOS region (LDMOS_XTOR marked Region)

MDP.10

Min/Max MVPSD overlap onto the channel (LDMOS_XTOR AND COMP AND POLY2 AND Pplus)

0.4

MDP.10a

Min MVPSD space within LDMOS_XTOR marking [diff potential]

2

MDP.10b

Min MVPSD space [same potential]

Merge if space less than 1um

1

MDP.11

Min MVPSD enclosing PCOMP in the drain (MVPSD AND COMP NOT POLY2)

direction and in the direction along the transistor width.

0.8

MDP.12

Min DNWELL enclose Nplus guard ring (NCOMP)

0.66

MDP.13

Wide width transistor can be used with multi finger with following rules

MDP.13a

Max single finger width

50

MDP.13b

Layout shall have alternative source & drain

MDP.13c

Both sides of the transistor shall be terminated by source

MDP.14

Others unlisted layer like Nplus, Pplus, Nwell, Contact, Metal, VIA, shall follow

MV rules listed in section 7.0

MDP.15

Min “DNWELL enclosing MVPSD” to any DNWELL spacing

6

MDP.16a

Min LDPMOS drain COMP width

0.22

MDP.16b

Min LDPMOS drain COMP enclose contact

0

MDP.17

  1. For better latch up immunity, it is necessary to put DNWELL guard ring Check DRC

Between “MVPSD Inside DNWELL covered by LDMOS_XTOR” and NCOMP

(outside DNWELL and outside Nwell) when spacing between them is less than 40um

  1. Layout for DNWELL guard ring shall follow rule DN.1, DN.2a, DN.2b, DN.3,

DF.4b, DF.18, and MDP.15.

  1. DNWELL guard ring shall have NCOMP tab to be connected to highest Potential.

  2. DNWELL guard ring length shall be bigger than the width of “MVPSD inside Check DRC DNWELL” and NCOMP.

LDPMOS LDPMOS LDPMOS LDPMOS