14.0 Reliability Related Rules And GuidelinesΒΆ
In this section some general guidelines (not all-inclusive) are provided to improve reliability in circuit design. Since reliability involves many aspects of circuit design, it is the responsibility of circuit designers to guarantee design conformance, reliability and manufacturability of their final product designs for intended applications.
- 14.1 Chip Operating Conditions
- 14.2 Electro-migration
- 14.3 Latch-up Rules and Guidelines
- 14.4 ESD Layout Guidelines
- 14.5 ESD Characterization Data
- 14.5.1 ESD Performance from 3.3V NMOS transistor
- 14.5.2 ESD Performance from 3.3V LV N+/PWELL diode
- 14.5.3 ESD Performance from 3.3V LV P+/NWELL diode
- 14.5.4. ESD Performance from 3.3V LV NWELL/PSUB diode
- 14.5.5 ESD Performance from 5V/6V NMOS transistor
- 14.5.6 ESD Performance from 5V/6V PMOS transistor
- 14.5.7 ESD Performance from 5V/6V HV N+/PWELL diode
- 14.5.8 ESD Performance from 5V/6V HV P+/NWELL diode
- 14.6 Stress Relief Guidelines